Original language | Undefined/Unknown |
---|---|
Pages (from-to) | 165-168 |
Number of pages | 4 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 120 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 1996 |
2 MeV Si ion implantation damage in relaxed Si1- xGex
C. O'Raifeartaigh, R.C. Barklie, A. Nylandsted Larsen, F. Priolo, G. Franzó, G. Lulli, M. Bianconi, J.K.N. Lindner, F. Cristiano, P.L.F. Hemment
Research output: Contribution to journal › Article › peer-review
2
Citations
(Scopus)