Current profiling and transverse mode control in broad area lasers

G. Huyet, J. Houlihan, J. R. O'Callaghan, C. Sailliot, V. Voignier, B. Corbett, J. G. McInerney

Research output: Contribution to journalConference articlepeer-review


The coherence properties of high power semiconductor lasers with a modified transverse current profile were analyzed. Current profiling can be implemented in vertical cavity lasers with proton implementation or imhomogeneous optical pumping. The analysis of beam propagation demonstrated that the device emits on a single transverse mode which can be focused into a single-mode fiber.

Original languageEnglish
Pages (from-to)659-660
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Publication statusPublished - 2001
Event14th Annual Meeting of the IEEE Lasers and Electro-Optics Society - San Diego, CA, United States
Duration: 11 Nov 200115 Nov 2001


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