Current profiling in broad-area semiconductor lasers

V. Voignier, C. Sailliot, J. Houlihan, J. R. O'Callaghan, G. Wu, G. Huyet, J. G. McInerney

Research output: Contribution to journalConference articlepeer-review

Abstract

We describe the different mechanisms to generate waves in the transverse section of lasers. Our analysis, based on the Maxwell-Bloch equations, is compared to recent experimental results.

Original languageEnglish
Pages (from-to)336-343
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4646
DOIs
Publication statusPublished - 2002
Externally publishedYes
EventPhysics and Simulation of Optoelectronic Devices X - San Jose, CA, United States
Duration: 21 Jan 200225 Jan 2002

Fingerprint

Dive into the research topics of 'Current profiling in broad-area semiconductor lasers'. Together they form a unique fingerprint.

Cite this