Electron paramagnetic resonance characterization of defects produced by ion implantation into silicon

RC Barklie, C O’Raifeartaigh

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)S2351
JournalJournal of Physics: Condensed matter
Volume17
Issue number22
Publication statusPublished - 2005
Externally publishedYes

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