Normal-Incidence PEEM Imaging of Propagating Modes in a Plasmonic Nanocircuit

Gary Razinskas, Deirdre Kilbane, Pascal Melchior, Peter Geisler, Enno Krauss, Stefan Mathias, Bert Hecht, Martin Aeschlimann

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

The design of noble-metal plasmonic devices and nanocircuitry requires a fundamental understanding and control of the interference of plasmonic modes. Here we report the first visualization of the propagation and interference of guided modes in a showcase plasmonic nanocircuit using normal-incidence nonlinear two-photon photoemission electron microscopy (PEEM). We demonstrate that in contrast to the commonly used grazing-incidence illumination scheme, normal-incidence PEEM provides a direct image of the structure's near-field intensity distribution due to the absence of beating patterns and despite the transverse character of the plasmonic modes. Based on a simple heuristic numerical model for the photoemission yield, we are able to model all experimental findings if global plane wave illumination and coupling to multiple input/output ports, and the resulting interference effects are accounted for.

Original languageEnglish
Pages (from-to)6832-6837
Number of pages6
JournalNano Letters
Volume16
Issue number11
DOIs
Publication statusPublished - 09 Nov 2016
Externally publishedYes

Keywords

  • control
  • nanocircuitry
  • near-field imaging
  • photoemission electron microscope
  • Plasmon propagation
  • plasmonic functional device

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